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第三代
半導(dǎo)體測試家族
Third generation semiconductor testing family
分類
 
QT-8100 Digital-Analog Hybrid IC Test System (Cable-Mount)

Suitable for conventional DC and AC parameter testing and functional testing of hybrid and analog IC devices. Main test subjects include: power management, digital consumer, motor drive, audio amplifier, operational amplifier, etc.



Suspended power supply

Multiple sites in parallel

Multi-channel high precision

Supports multiple extensions

Model QT-8100
Product Advantages

The digital-analog hybrid IC test system is suitable for conventional DC and AC parameter testing and functional testing of hybrid and analog IC devices. Main test subjects include: power management, digital consumer, motor drive, audio amplifier, operational amplifier, etc.

Key Features ? Floating source, digital frequency 25.6MHz, vector depth 64M
? 18 bit high-precision sampling
? 600+ digital-analog hybrid test channels, multiple 1000V/20A high-voltage and high-current
? Multi-channel high-precision time measurement unit, sustaining ns-level time measurement
? Support RF module expansion
? Efficient and accurate communication configuration, test efficiency further upgraded

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