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第三代
半導(dǎo)體測(cè)試家族
Third generation semiconductor testing family
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QT-DRM101000 GaN Dynamic RDON

Suitable for dynamic RDON parameter testing of gallium nitride. Can be combined with QT-4100, QT-8000 to form a test solution



Hard handover <1us

Supports resistive/

inductive loads

Support hard/

soft handover

Multiple-pulse output

Type QT-DRM101000
Advantages

QT-DRM101000 is suitable for dynamic RDON parameter testing of gallium nitride. Can be combined with QT-4100, QT-8000 to form a test solution

Main Features

? Support FT or CP, laboratory, mass production testing

? Hard handover and soft handover, hard handover can meet the requirement of<1uS measurement RDON

? Output capacity 10A/1000V




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